Shrewsbury, MA, United States of America

Yang Wang

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Worcester Polytechnic Institute. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yang Wang. Retrieved from https://idiyas.com/inventor/yang-wang-umgls9o4

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Yang Wang and Magnetic-Tolerant Imaging

Introduction

Yang Wang is an inventor associated with Worcester Polytechnic Institute in Shrewsbury, Massachusetts. His patent work addresses multimodal imaging in environments where magnetic compatibility is important.

Latest Patents

Wang is credited with 1 patent, titled “Magnetic Tolerant Imaging.” The invention describes a multimode imaging device with an elongated probe and a sensor that can rotate in relation to the probe. The device combines images from two imaging modalities: a first modality that images the region containing the probe and a second modality detected by the sensor. Its control and imaging circuits activate the modalities, align their images in a shared frame of reference, and produce a combined image.

Career Highlights

Wang’s listed invention focuses on coordinating different imaging technologies and registering their outputs into a unified view. This approach is intended to support imaging in settings where magnetic tolerance is a relevant design consideration.

Collaborations

Wang’s listed coworkers include Haichong Zhang and Ryo Murakami. His patent is associated with Worcester Polytechnic Institute.

Conclusion

Yang Wang’s patent on magnetic-tolerant multimode imaging highlights an approach to combining and aligning images from distinct modalities in a common frame of reference.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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