This inventor holds 1 USPTO granted patent. Top assignee: Mirae Corporation. Active years: 2003.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2003
Title: Innovations by Yang Hee Kim
Introduction
Yang Hee Kim is a notable inventor based in Chungchongnam-do, South Korea. She has made significant contributions to the field of device testing technology. Her innovative approach has led to the development of a unique device test handler that enhances testing efficiency.
Latest Patents
Yang Hee Kim holds a patent for a "Device test handler and method for operating the same." This invention provides a significant reduction in the picking up and placing time periods, while also minimizing potential damage to the devices being tested. The device test handler allows for both room temperature and high temperature testing within a single unit, maximizing testing efficiency. It includes a pre-heater for pre-heating devices on a loading shuttle as it passes to a test chamber. An indexing device within the test chamber facilitates the transfer of devices from the loading shuttle to the test socket, and subsequently from the test socket to an unloading shuttle. Additionally, heat supply means are provided for high temperature testing when necessary. The unloading part features multiple trays that transfer devices from the unloading shuttle to output trays based on testing results.
Career Highlights
Yang Hee Kim is currently employed at Mirae Corporation, where she continues to innovate in the field of device testing. Her work has been instrumental in improving the efficiency and effectiveness of testing processes.
Collaborations
Some of her coworkers include Hyun Soo Oh and Seong Bong Kim, who contribute to the collaborative environment at Mirae Corporation.
Conclusion
Yang Hee Kim's contributions to device testing technology exemplify the impact of innovative thinking in engineering. Her patent reflects a commitment to enhancing testing efficiency and reducing potential damage to devices.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
