Qingdao, China

Yan Zhang

This inventor holds 1 USPTO granted patent. Top assignee: Ocean University of China. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yan Zhang. Retrieved from https://idiyas.com/inventor/yan-zhang-bx1kfjsw

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 8.0

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Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Yan Zhang - Innovator in Submarine Monitoring Technology

Introduction

Yan Zhang is a prominent inventor based in Qingdao, China. He has made significant contributions to the field of underwater monitoring technology. His innovative work focuses on enhancing the understanding of deep submarine turbidity currents.

Latest Patents

Yan Zhang holds a patent for a "Device for multi-parameter integrated monitoring of deep submarine turbidity current." This device is designed to monitor various parameters such as cement pile pore-pressure, optical turbidity, flow velocity, and sediment sampling. It allows for simultaneous and real-time transmission of data, ensuring accurate in-situ monitoring. This innovation addresses the challenges posed by the movement of monitoring apparatuses during regular operations.

Career Highlights

Yan Zhang is affiliated with the Ocean University of China, where he continues to advance research in marine technology. His work has garnered attention for its practical applications in environmental monitoring and marine research.

Collaborations

Yan collaborates with notable colleagues, including Tao Liu and Guanli Wei, who contribute to his research endeavors. Their combined expertise enhances the development of innovative solutions in the field.

Conclusion

Yan Zhang's contributions to submarine monitoring technology exemplify the impact of innovation in environmental science. His patented device represents a significant advancement in the ability to monitor underwater currents effectively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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