Yan Xiaolang

Title: Yan Xiaolang - Innovator in Optical Measurement Technology

Introduction

Yan Xiaolang is a prominent inventor based in Beijing, China. He has made significant contributions to the field of optical measurement technology. His innovative work has led to the development of advanced instruments that enhance the accuracy and efficiency of optical measurements.

Latest Patents

Yan Xiaolang holds a patent for a Broadband Polarization Spectrometer with Inclined Incidence and Optical Measurement System. This oblique incidence broadband spectroscopic polarimeter is designed to be easy to adjust for focus, achromatic, and capable of maintaining polarization while featuring a simple structure. The device comprises at least one polarizer, at least one curved reflector element, and at least two flat reflector elements. By utilizing the flat reflector element, the polarimeter can change the propagation direction of the beam and compensate for polarization changes caused by the reflective focusing unit. This innovation allows for accurate measurement of the optical constants of sample materials, film thickness, and critical dimension properties, as well as three-dimensional profiles for analyzing periodic structures of samples.

Career Highlights

Yan Xiaolang is associated with Beioptics Technology Co., Ltd., where he continues to push the boundaries of optical technology. His work has garnered attention for its practical applications in various industries, enhancing the capabilities of optical measurement systems.

Collaborations

Yan collaborates with talented individuals such as Guoguang Li and Tao Liu, contributing to a dynamic team focused on advancing optical measurement technologies.

Conclusion

Yan Xiaolang's innovative contributions to optical measurement technology exemplify the impact of dedicated inventors in the field. His work not only advances scientific understanding but also enhances practical applications in various industries.