Company Filing History:
Years Active: 2015-2016
Title: Yan-Wei Tien: Innovator in Defect Management Systems
Introduction
Yan-Wei Tien is a prominent inventor based in Hualien, Taiwan, recognized for his contributions to defect management systems. With a total of two patents to his name, Tien has made significant strides in improving the methodologies used in defect analysis and management, particularly within the semiconductor industry.
Latest Patents
One of Yan-Wei Tien's most notable patents involves the development of defect management systems and methods. This innovation introduces an automated defect classification (ADC) module, a lithographic plane review (LPR) module, and a defect progression monitor (DPM) module, all of which work in concert to manage defects on various objects. The DPM module communicates with the ADC and LPR modules to determine whether repair or cleaning of the object is necessary based on the information received.
Another impactful patent focuses on the system and method for defect analysis of a substrate. This approach utilizes two images: one of the defect present on a substrate and the other of a reference substrate. By determining the differences between these images, a simulation model generates a simulation curve that aids in assessing the substrate's condition. Additionally, scans of the substrate can create a statistical process control chart, which is vital for maintaining quality standards.
Career Highlights
Yan-Wei Tien is employed at Taiwan Semiconductor Manufacturing Company Limited, a leading player in the semiconductor industry. His work there revolves around enhancing defect management protocols, which are crucial for the production of high-quality semiconductor products.
Collaborations
During his career, Tien has collaborated with esteemed colleagues, including Chi-Hung Liao and Ming-Yi Lee. Their combined expertise has contributed to the development of innovative solutions within the field of semiconductor manufacturing and defect management.
Conclusion
In summary, Yan-Wei Tien stands out as an inventive force in the realm of defect management systems. His patents have paved the way for improved quality assurance processes in semiconductor manufacturing, showcasing his commitment to innovation and collaboration in technology.