Taipei, China

Yan-Mei Jiang

This inventor holds 1 USPTO granted patent. Top assignee: Microsoft Technology Licensing, LLC. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yan-Mei Jiang. Retrieved from https://idiyas.com/inventor/yan-mei-jiang-o83ie7we

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 9.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Yan-Mei Jiang and User-Driven Event Recording

Introduction

Yan-Mei Jiang is an inventor associated with Taipei, CN, and Microsoft Technology Licensing, LLC. Her patent work addresses ways to capture user interactions within computing systems and make those records useful for software debugging.

Latest Patents

The provided information lists one patent for Jiang: Recording User-Driven Events Within a Computing System. The invention describes interfaces that allow a recorder application to collect and record user-driven events from an input method editor and from a user-interface control that does not expose such events through standard system calls. The recorded event data can then be sent directly to a bug-tracking application for inclusion in a bug database. Jiang is credited with 1 patent in the supplied data.

Career Highlights

Jiang’s listed patent reflects work on improving how software teams capture and investigate user-interface behavior. By enabling event recording across components with different access limitations, the described technology can help provide useful context for diagnosing software defects.

Collaborations

The supplied information names Yuli Huang and Michael Jen-Chiung Chang as Jiang’s coworkers. Their specific roles in the patent or related work are not provided.

Conclusion

Yan-Mei Jiang’s listed invention focuses on recording user-driven events across computing interfaces and making those records available to bug-tracking systems, supporting more informed software debugging.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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