Teddington, United Kingdom

Yameng Cao

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Npl Management Limited. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yameng Cao. Retrieved from https://idiyas.com/inventor/yameng-cao

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
Loading Chart...
1 patent (USPTO):Explore Patents

Title: Yameng Cao and Electromagnetic Radiation Measurement

Introduction

Yameng Cao is an inventor based in Teddington, Great Britain. His patent work includes an electromagnetic radiation measurement device designed to measure radiation across different wavelength bands.

Latest Patents

Cao is associated with 1 patent: “Electromagnetic Radiation Measurement Device.” The invention combines an electromagnetic radiation sensor with a reconfigurable filter assembly. The assembly can be set to different configurations, each filtering a distinct wavelength band. Adjacent bands overlap, defining differential sub-bands, and a processor uses sensor measurements from the different configurations to derive measurement values for those sub-bands.

Career Highlights

Cao is associated with NPL Management Limited. His patented device describes an approach to measuring electromagnetic radiation across multiple wavelength bands using a reconfigurable filter and processor.

Collaborations

The provided information identifies Sebastian Wood and Fernando Castro as Cao’s coworkers. It does not specify their roles in the patent or the extent of their collaboration.

Conclusion

Yameng Cao’s patent describes a measurement device that uses overlapping wavelength bands and processor-based analysis to derive values for differential sub-bands.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…