Jerusalem, Israel

Yair Shpitzer


 

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Yair Shpitzer: Innovator in Air Contaminant Detection

Introduction

Yair Shpitzer is a notable inventor based in Jerusalem, Israel. He has made significant contributions to the field of environmental monitoring, particularly in the detection of air contaminants. His innovative approach has led to the development of a patented method that enhances the accuracy of air quality assessments.

Latest Patents

Yair Shpitzer holds a patent for a "Method for open path detection of air contaminants." This patent describes a method for detecting the concentration of air contaminants by obtaining an average sample single beam value and an average background single beam value. The process involves comparing these values to determine the concentration of air contamination. The method continuously updates the averages upon detection of new single beam measurements, ensuring real-time monitoring of air quality. He has 1 patent to his name.

Career Highlights

Shpitzer is associated with Atmosfir Optics Ltd., where he applies his expertise in optics and environmental science. His work focuses on developing advanced technologies for air quality monitoring, contributing to public health and safety.

Collaborations

Yair has collaborated with notable colleagues, including Ram Hashmonay and Robert Howard Kagann. These partnerships have fostered innovation and enhanced the development of effective air monitoring solutions.

Conclusion

Yair Shpitzer's contributions to air contaminant detection exemplify the importance of innovation in environmental science. His patented method represents a significant advancement in monitoring air quality, showcasing his commitment to improving public health.

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