Beersheba, Israel

Yair Rascovsky

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Cardinalops Ltd.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yair Rascovsky. Retrieved from https://idiyas.com/inventor/yair-rascovsky

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Yair Rascovsky: Innovator in Zero Hit Analysis Systems

Introduction

Yair Rascovsky is a notable inventor based in Beersheba, Israel. He has made significant contributions to the field of data analysis through his innovative patent. His work focuses on enhancing the efficiency of data processing systems.

Latest Patents

Rascovsky holds a patent for a "Zero Hit Analysis System." This invention includes a device with a processor that receives a given rule from a service. The rule consists of multiple statements, and the device identifies a zero-hit statement that causes zero hits against the log data. Upon identifying this statement, the processor performs an action responsively.

Career Highlights

Yair Rascovsky is associated with CardinalOps Ltd., where he applies his expertise in data analysis and system optimization. His work has been instrumental in developing solutions that improve data handling and analysis.

Collaborations

Rascovsky collaborates with talented individuals such as Amihai Hadar and David Baumstein. Their combined efforts contribute to the advancement of innovative technologies in their field.

Conclusion

Yair Rascovsky's contributions to the field of data analysis through his zero hit analysis system exemplify his innovative spirit. His work continues to influence the way data is processed and analyzed in various applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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