Omer, Israel

Yair Gur-Aryeh Chuchem

This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yair Gur-Aryeh Chuchem. Retrieved from https://idiyas.com/inventor/yair-gur-aryeh-chuchem

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Yair Gur-Aryeh Chuchem: Inventor in Storage Verification

Introduction

Yair Gur-Aryeh Chuchem is an inventor based in Omer, Israel, whose patent work concerns data verification in storage systems. He is associated with International Business Machines Corporation.

Latest Patents

Chuchem is credited with 1 patent, titled “Deterministic Data Verification in Storage Controller.” The invention describes methods, systems, and computer program embodiments that enable a storage controller to verify data deterministically. Concurrent write tasks may be assigned to overlapping storage ranges using pseudo-random data generated from a seed and a range map that tracks the chronological order of write operations. Read tasks are then analyzed by comparing data from a subrange with the seed associated with that subrange.

Career Highlights

The patent reflects work on reliable verification of data written to storage, including scenarios involving concurrent operations and overlapping ranges. Chuchem’s association with IBM places this work within the company’s broader technology and research activities.

Collaborations

Adi Goldfarb and Zohar Zilberman are identified as Chuchem’s coworkers. Their shared professional context connects Chuchem’s work to a wider team environment.

Conclusion

Yair Gur-Aryeh Chuchem’s patent focuses on deterministic data verification in storage controllers, addressing how systems can track concurrent writes and validate subsequent reads.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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