This inventor holds 2 USPTO granted patents. Top assignee: Marvell Israel (Misl) Ltd.. Active years: 2012-2013.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2012-2013
Title: Yair Faiershtein: Innovator in Integrated Circuit Testing
Introduction
Yair Faiershtein is a notable inventor based in Nazareth Illit, Israel. He has made significant contributions to the field of integrated circuit testing, particularly in the area of alpha particle emissions. With a total of 2 patents to his name, Faiershtein's work is crucial for advancing the reliability and accuracy of integrated circuits.
Latest Patents
Faiershtein's latest patents focus on integrated circuit sample preparation for alpha emission measurements. These patents describe test samples for conducting integrated circuit alpha particle emissions testing, as well as processes for preparing these test samples. The innovative approach considers the relative physical positions of components within a final integrated circuit package. It also addresses the potential contamination of individual components or the entire integrated circuit package during the production process. His work is particularly relevant for integrated circuits with extremely low alpha particle emission levels, specifically in the ultra-low alpha region, where emissions are less than 0.002 cph/cm.
Career Highlights
Yair Faiershtein is currently employed at Marvell Israel Ltd., where he continues to develop and refine his innovative techniques in integrated circuit testing. His expertise in this specialized field has positioned him as a key player in advancing technology related to alpha particle emissions.
Collaborations
Faiershtein collaborates with talented coworkers, including Ran Manor and Gil Weisman, who contribute to the innovative environment at Marvell Israel Ltd. Their combined efforts enhance the research and development of cutting-edge technologies in integrated circuits.
Conclusion
Yair Faiershtein's contributions to integrated circuit testing and his innovative patents play a vital role in the advancement of technology in this field. His work not only improves testing methodologies but also ensures the reliability of integrated circuits in various applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile