Hefei, China

Yahong Xie

This inventor holds 1 USPTO granted patent. Top assignee: Chinese Academy of Sciences. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yahong Xie. Retrieved from https://idiyas.com/inventor/yahong-xie-t8e3rmg3

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Innovations of Yahong Xie in Neutral Beam Injection Technology.

Introduction

Yahong Xie is a notable inventor based in Hefei, China. He has made significant contributions to the field of neutral beam injection technology. His work focuses on optimizing the operational parameters of ion sources, which is crucial for advancements in plasma physics.

Latest Patents

Yahong Xie holds a patent for a "Neutral Beam Injection Power Feedback Control Method." This invention addresses the optimal matching relationship of operating parameters of the ion source by analyzing the ion optical characteristics of a hot cathode ion source. The method aims to expand the optimal operating range of the ion source. It includes two primary methods for dynamic adjustment of beam power, ensuring effective control during injection cycles.

Career Highlights

Yahong Xie is affiliated with the Chinese Academy of Sciences, where he conducts research and development in advanced technologies. His innovative approach has led to significant advancements in the field of neutral beam injection.

Collaborations

Yahong Xie collaborates with Lizhen Liang, who is also involved in research related to neutral beam injection technology. Their partnership enhances the research outcomes and contributes to the development of new methodologies in the field.

Conclusion

Yahong Xie's contributions to neutral beam injection technology demonstrate his commitment to advancing scientific knowledge and practical applications. His innovative methods and collaborative efforts continue to influence the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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