Haifa, Israel

Yaacob Ben-Aryeh

This inventor holds 1 USPTO granted patent. Top assignee: Technion Research & Development Foundation Ltd. Active years: 1988.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yaacob Ben-Aryeh. Retrieved from https://idiyas.com/inventor/yaacob-ben-aryeh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 1988

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1 patent (USPTO):Explore Patents

Title: The Innovations of Yaacob Ben-Aryeh

Introduction

Yaacob Ben-Aryeh is a notable inventor based in Haifa, Israel. He has made significant contributions to the field of electromagnetic wave technology. His work focuses on amplifying and generating electromagnetic wave radiation through innovative methods.

Latest Patents

Yaacob Ben-Aryeh holds 1 patent for his invention related to electromagnetic wave amplifiers and generators. The patent describes a method and apparatus for amplifying and/or generating electromagnetic wave radiation. This involves creating a gas plasma region with a non-Maxwellian electron distribution, which enhances the amplification of radiation through stimulated emission of Bremstrahlung from scattered free electrons.

Career Highlights

Ben-Aryeh has been associated with the Technion Research & Development Foundation Limited, where he has contributed to various research projects. His expertise in electromagnetic wave technology has positioned him as a key figure in his field.

Collaborations

He has collaborated with notable colleagues, including Avner Rosenberg and Jacob Politch, to advance research and development in electromagnetic technologies.

Conclusion

Yaacob Ben-Aryeh's innovative work in electromagnetic wave amplifiers and generators showcases his significant contributions to technology. His patent reflects a deep understanding of plasma physics and its applications in modern technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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