Beijing, China

Ya-Ping Zhang

This inventor holds 1 USPTO granted patent. Top assignee: Keysight Technologies, Inc.. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ya-Ping Zhang. Retrieved from https://idiyas.com/inventor/ya-ping-zhang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: The Innovations of Ya-Ping Zhang

Introduction

Ya-Ping Zhang is a notable inventor based in Beijing, China. He has made significant contributions to the field of measurement technology. His work focuses on enhancing the efficiency and accuracy of test fixtures in various applications.

Latest Patents

Ya-Ping Zhang holds a patent for "Automatic fixture removal using one-port measurement." This innovative patent involves measuring the scattering parameters of a test fixture with a first port and a second port. The process includes outputting a one-port reflection test signal and receiving a one-port reflection measurement signal. The invention utilizes time gating techniques to derive scattering parameters, showcasing Zhang's expertise in measurement technology.

Career Highlights

Ya-Ping Zhang is currently employed at Keysight Technologies, Inc., a leading company in electronic measurement solutions. His role involves developing advanced measurement techniques that contribute to the company's innovative product offerings. Zhang's work is instrumental in pushing the boundaries of measurement technology.

Collaborations

Some of his notable coworkers include Joel P. Dunsmore and Ning Cheng. Their collaboration fosters a creative environment that enhances the development of cutting-edge technologies.

Conclusion

Ya-Ping Zhang's contributions to measurement technology through his patent and work at Keysight Technologies, Inc. highlight his role as an influential inventor in the field. His innovative approaches continue to shape the future of electronic measurement solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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