Taichung, Taiwan

Ya-Han Chang

This inventor holds 1 USPTO granted patent. Top assignee: Giant Manufacturing Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ya-Han Chang. Retrieved from https://idiyas.com/inventor/ya-han-chang-gtm8l2w0

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Innovations by Ya-Han Chang in Bike Fitting Technology

Introduction

Ya-Han Chang is an innovative inventor based in Taichung, Taiwan. He has made significant contributions to the field of bike fitting technology. His work focuses on enhancing the cycling experience through advanced systems and methods.

Latest Patents

Ya-Han Chang holds a patent for a "System, method, and non-volatile computer-readable storage medium applied for bike fitting." This invention includes an image capture device, a first force sensor, and a processor. The system captures an image of a user riding a bicycle and detects the force exerted on the bike. The processor determines the user's riding position and generates a bicycle specification based on the collected data.

Career Highlights

Chang is currently employed at Giant Manufacturing Co., Ltd., a leading company in the bicycle industry. His work at Giant has allowed him to apply his innovative ideas in practical settings, contributing to the development of advanced cycling technologies.

Collaborations

Ya-Han Chang collaborates with talented coworkers, including Chin-Lai Huang and Chih-Kai Chang. Their teamwork fosters a creative environment that drives innovation in bike fitting solutions.

Conclusion

Ya-Han Chang's contributions to bike fitting technology exemplify the impact of innovation in enhancing user experience. His patent and work at Giant Manufacturing Co., Ltd. highlight his commitment to advancing cycling technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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