Hangzhou, China

Xunlong Xia

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Hangzhou Hikvision Digital Technology Co., Ltd.. Active years: 2021.


% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Xunlong Xia: Innovator in Camera Calibration Technology

Introduction

Xunlong Xia is a notable inventor based in Hangzhou, China. He has made significant contributions to the field of camera technology, particularly in the area of parameter calibration. His innovative approach has the potential to enhance the efficiency and accuracy of camera calibration processes.

Latest Patents

Xunlong Xia holds a patent for a "Camera parameter calibration method, device, apparatus, and system." This invention provides a method and system for calibrating camera parameters by capturing images of multiple checkerboard targets. The calibration image, which contains several checkerboards, allows for improved calibration efficiency by eliminating the need to adjust the position or posture of the checkerboard target multiple times. This solution also reduces errors associated with capturing calibration images, thereby enhancing the overall accuracy of the calibration process.

Career Highlights

Xunlong Xia is currently employed at Hangzhou Hikvision Digital Technology Co., Ltd. His work at this leading technology company has allowed him to focus on developing advanced imaging solutions. His expertise in camera technology has positioned him as a key player in the industry.

Collaborations

Xunlong Xia collaborates with talented professionals such as Kui Zhang and Hui Mao. Their combined efforts contribute to the innovative projects at Hangzhou Hikvision Digital Technology Co., Ltd.

Conclusion

Xunlong Xia's contributions to camera calibration technology exemplify the impact of innovation in enhancing imaging solutions. His work not only improves calibration efficiency but also sets a new standard for accuracy in the field.

Profile summary based on public USPTO records.
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