Nanjing, China

Xuemei Hu

This inventor holds 1 USPTO granted patent. Top assignee: Nanjing University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xuemei Hu. Retrieved from https://idiyas.com/inventor/xuemei-hu-qmf08yqm

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Xuemei Hu: Innovator in Imaging Technology

Introduction

Xuemei Hu is a prominent inventor based in Nanjing, China. She has made significant contributions to the field of imaging technology. Her innovative work has led to the development of a unique imaging method and apparatus.

Latest Patents

Xuemei Hu holds a patent for an "Imaging method and apparatus, and computer-readable medium." This invention provides a method that includes photographing and quantification at a first resolution to obtain a first image. It also involves performing photographing and differential processing at a second resolution to obtain a second image. The differential processing quantifies the difference between pixel points, ultimately fusing the first and second images to create a third image. This method enhances imaging capabilities by utilizing different resolutions and bit widths.

Career Highlights

Xuemei Hu is affiliated with Nanjing University, where she continues to advance her research in imaging technology. Her work has garnered attention for its innovative approach and practical applications in various fields.

Collaborations

She collaborates with notable colleagues, including Chenxi Qiu and Kai Wang, who contribute to her research endeavors.

Conclusion

Xuemei Hu's contributions to imaging technology exemplify her innovative spirit and dedication to advancing the field. Her patent reflects her expertise and commitment to developing cutting-edge solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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