Niskayuna, NY, United States of America

Xuan Yi

This inventor holds 1 USPTO granted patent and 3 published patent applications. Top assignee: Ge Aviation Systems Limited. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xuan Yi. Retrieved from https://idiyas.com/inventor/xuan-yi-l4pxlncv

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Xuan Yi - Innovator in Electrical Testing Systems

Introduction

Xuan Yi is a notable inventor based in Niskayuna, NY (US). He has made significant contributions to the field of electrical testing systems. His innovative approach has led to the development of a unique patent that enhances the efficiency of electrical cable testing.

Latest Patents

Xuan Yi holds a patent for a Multi-functional Integrated Testing System. This system is designed to conduct a sequence of electrical tests on electrical cables. It includes a testing unit, a set of sensors, and two circuits. The two circuits are switchably coupled to a common voltage source and can be selectively electrically coupled to the electric cable. This design enables the testing unit to conduct respective tests of the electrical cable effectively.

Career Highlights

Xuan Yi is currently employed at GE Aviation Systems Limited, where he continues to innovate and develop advanced testing solutions. His work has been instrumental in improving the reliability and performance of electrical systems.

Collaborations

Xuan Yi collaborates with his coworker, Han Xiong, to further enhance their projects and share insights in their field of expertise.

Conclusion

Xuan Yi's contributions to electrical testing systems exemplify the spirit of innovation. His patent for the Multi-functional Integrated Testing System showcases his commitment to advancing technology in this area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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