Fujian, China

Xuan He

This inventor holds 1 USPTO granted patent. Top assignee: Contemporary Amperex Technology Co., Ltd.. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xuan He. Retrieved from https://idiyas.com/inventor/xuan-he-5a4bnom9

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 11.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Xuan He and Simulation-Based Control Software Testing.

Introduction

Xuan He is an inventor associated with Fujian, China, and Contemporary Amperex Technology Co., Ltd. His work includes an invention aimed at making simulation-based testing of control software more efficient. The supplied information lists 1 patent for him.

Latest Patents

He is named on the patent “Method and Apparatus for Testing Control Software by Injecting Fault Signals into a Simulation Environment, and Computer-Readable Storage Medium.” The invention describes obtaining test information for multiple fault signals and injecting those signals into a simulation environment in sequence. The control software handles the signals, and the resulting test outcomes can support debugging. The stated goal is to reduce the time required for simulation-based debugging and improve efficiency.

Career Highlights

The available information connects He with Contemporary Amperex Technology Co., Ltd. and identifies his patent contribution in control software testing. Further details about his role, education, and career history were not provided.

Collaborations

Bin Lan and Jianfeng Guo are identified as He’s coworkers. The supplied information does not specify their roles in the patent or the nature of their collaboration.

Conclusion

Xuan He’s listed invention applies sequential fault-signal testing in a simulation environment to help streamline control software debugging.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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