Xu Zhang

Title: Xu Zhang: Innovator in Eddy Current Thermography

Introduction

Xu Zhang is a prominent inventor based in Sichuan, China. He has made significant contributions to the field of thermography through his innovative methods. His work focuses on enhancing defect reconstruction techniques, which are crucial in various industrial applications.

Latest Patents

Xu Zhang holds a patent titled "Method for eddy current thermography defect reconstruction based on electrical impedance tomography." This invention provides a novel approach to defect reconstruction by first obtaining a thermal reference image of temperature changes over time. The process involves acquiring a thermogram sequence of the specimen during heating, fitting a curve for each pixel, and creating a current matrix along with a magnetic potential matrix. Through iterative calculations, the conductivity distribution is determined, leading to the identification and quantification of defect profiles.

Career Highlights

Xu Zhang is affiliated with the University of Electronic Science and Technology of China. His academic background and research focus have positioned him as a key figure in the field of electrical engineering and thermography. His innovative methods have the potential to improve the accuracy and efficiency of defect detection in various materials.

Collaborations

Xu Zhang has collaborated with notable colleagues, including Libing Bai and Chao Ren. These partnerships have fostered a collaborative environment that enhances research and development in their respective fields.

Conclusion

Xu Zhang's contributions to eddy current thermography and defect reconstruction highlight his innovative spirit and dedication to advancing technology. His work not only showcases his expertise but also paves the way for future advancements in the field.