Fremont, CA, United States of America

Xiping Wang

This inventor holds 1 USPTO granted patent. Top assignee: Csi Wireless Inc.. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xiping Wang. Retrieved from https://idiyas.com/inventor/xiping-wang-x7y5dczi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 20(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Xiping Wang - Innovator in WLAN Signal Strength Determination

Introduction

Xiping Wang is a notable inventor based in Fremont, CA (US). He has made significant contributions to the field of wireless communication technology. His innovative work focuses on enhancing the accuracy of WLAN signal strength determination.

Latest Patents

Xiping Wang holds a patent for a "System and method for WLAN signal strength determination." This patent describes a method that involves receiving a WLAN RF signal, converting it to a voltage proportional to the signal, comparing this voltage to a first reference voltage, and outputting data corresponding to WLAN RF signal strength if the voltage exceeds the reference voltage. This invention is crucial for improving the reliability of wireless networks.

Career Highlights

Xiping Wang is currently employed at Csi Wireless Inc., where he continues to develop innovative solutions in wireless technology. His work has been instrumental in advancing the capabilities of WLAN systems.

Collaborations

Xiping Wang collaborates with Hamid Najafi, a fellow innovator in the field. Their combined expertise contributes to the development of cutting-edge technologies in wireless communication.

Conclusion

Xiping Wang's contributions to WLAN signal strength determination exemplify the importance of innovation in enhancing wireless communication. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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