Hangzhou, China

Xiongwei Liu

This inventor holds 1 USPTO granted patent. Top assignee: Zhejiang University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xiongwei Liu. Retrieved from https://idiyas.com/inventor/xiongwei-liu-jcjdaffe

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Xiongwei Liu: Innovator in Image Processing Technologies

Introduction

Xiongwei Liu is a prominent inventor based in Hangzhou, China. He has made significant contributions to the field of image processing, particularly in the development of methods that enhance the quality of color RAW images.

Latest Patents

Xiongwei Liu holds a patent for a "Joint denoising and demosaicking method for color RAW images guided by monochrome images." This innovative method involves constructing a synthetic image dataset from a monochrome-color binocular camera system for training and testing network modules. The process includes generating a high-quality aligned guidance image that aids in the joint denoising and demosaicking of color RAW images, ensuring accurate color representation while maintaining the structure of the guidance image.

Career Highlights

Xiongwei Liu is affiliated with Zhejiang University, where he continues to advance research in image processing technologies. His work has garnered attention for its practical applications in improving image quality in various digital imaging systems.

Collaborations

He has collaborated with notable colleagues, including Huiliang Shen and Runmin Zhang, contributing to the advancement of their shared research interests.

Conclusion

Xiongwei Liu's innovative work in image processing exemplifies the impact of research and development in enhancing digital imaging technologies. His contributions are paving the way for future advancements in this critical field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…