Chengdu, China

Xiongfei Zhou

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Southwest Jiaotong University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xiongfei Zhou. Retrieved from https://idiyas.com/inventor/xiongfei-zhou

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Xiongfei Zhou and Wheel-Rail Fatigue Simulation

Introduction

Xiongfei Zhou is an inventor based in Chengdu, China, associated with Southwest Jiaotong University. His patent work concerns rail transportation and the study of wheel-rail interactions.

Latest Patents

Zhou is named on 1 patent, titled “Wheel-Rail Steel Equivalent Fatigue Damage Simulation Method.” The invention describes a method for estimating the equivalent fatigue damage of wheel-rail steel. It uses a train’s load spectrum and a three-dimensional wheel-rail system model to simulate loading and determine the stress spectrum at a critical part of the wheel rim. The method then establishes the target stress and its application frequency for the expected simulated mileage, and uses a driving fatigue test machine to test a wheel-rail steel fatigue sample.

Career Highlights

The patent reflects work on applying simulation and fatigue testing to assess wheel-rail steel under train operating loads. This approach connects modeled service conditions with laboratory testing for a specified mileage.

Collaborations

The supplied information lists Lin Jing and Xingya Su as Zhou’s coworkers. His company affiliation is Southwest Jiaotong University.

Conclusion

Xiongfei Zhou’s documented invention focuses on simulating and testing equivalent fatigue damage in wheel-rail steel, contributing to research on rail transportation systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…