Shanghai, China

Xingchen Pan

This inventor holds 1 USPTO granted patent. Top assignee: Chinese Academy of Sciences. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xingchen Pan. Retrieved from https://idiyas.com/inventor/xingchen-pan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: **Xingchen Pan: Innovator in Phase Imaging Technology**

Introduction

Xingchen Pan, an innovative inventor based in Shanghai, China, has made significant contributions to the field of optical technology. His work focuses on developing advanced methods and devices that enhance the understanding and application of light fields, striving to overcome the limitations of traditional interferometry.

Latest Patents

Xingchen Pan holds a patent for a groundbreaking invention titled "Device and method for phase imaging and element detection based on wavefront modulation." This invention addresses critical issues in existing interferometric techniques, such as twin image elimination, limited resolution, under-sampling wavefront measurement, and multi-modal measurement. The invention utilizes iterative calculations to achieve precise measurements of complex amplitudes in light fields and effectively resolves twin image complications. It boasts multi-modal reconstruction capabilities and can reach the diffraction limit resolution, making it applicable in phase imaging, optical element surface-type detection, and polarization distribution measurement.

Career Highlights

Currently, Xingchen Pan is affiliated with the Chinese Academy of Sciences, where he is deeply engaged in research and development within the optical technology sector. His innovative approach and dedication have positioned him as a leader in the field of phase imaging.

Collaborations

Throughout his career, Xingchen Pan has collaborated with other notable researchers, including Cheng Liu and Jianqiang Zhu. These partnerships enhance the scope and impact of his work, contributing to advancements in optical measurement technologies.

Conclusion

Xingchen Pan's contributions to the field of optical technology through his innovative patent demonstrate a commitment to overcoming existing challenges in phase imaging. His work not only advances scientific understanding but also opens up new possibilities for applications across various domains, making him a significant figure in contemporary innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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