Chongqing, China

Xingbing Wu

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignees: Chongqing Gigachip Technology Co., Ltd., No. 24 Research Institute of China Electronics Technology Group Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xingbing Wu. Retrieved from https://idiyas.com/inventor/xingbing-wu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: The Innovations of Xingbing Wu

Introduction

Xingbing Wu is a notable inventor based in Chongqing, China. He has made significant contributions to the field of electronics, particularly with his innovative patent. His work reflects a commitment to advancing technology and improving imaging signal processing.

Latest Patents

Xingbing Wu holds a patent titled "Circuit and Method for Sampling Imaging Signal." This invention showcases his expertise in developing efficient methods for handling imaging signals, which is crucial in various electronic applications.

Career Highlights

Throughout his career, Wu has worked with prominent organizations, including the No. 24 Research Institute of China Electronics Technology Group Corporation and Chongqing Gigachip Technology Co., Ltd. His experience in these institutions has allowed him to hone his skills and contribute to significant technological advancements.

Collaborations

Xingbing Wu has collaborated with talented individuals such as Daiguo Xu and Xuebing Li. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Xingbing Wu's contributions to the field of electronics through his patent and collaborations highlight his role as an influential inventor. His work continues to inspire advancements in technology and signal processing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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