Xin-Ying Xie

Title: Innovations of Inventor Xin-Ying Xie

Introduction

Xin-Ying Xie is a notable inventor based in Shanghai, China. He has made significant contributions to the field of boundary-scan testing systems. With a total of 3 patents, his work focuses on enhancing the efficiency and effectiveness of testing methodologies in electronic devices.

Latest Patents

One of his latest patents is the "JTAG standard pin test system." This invention discloses a boundary-scan standard pin test system where to-be-tested slots are electrically connected to form different series chains. The system allows for efficient testing of various boards by utilizing a TAP controller to provide boundary-scan format test signals. Another significant patent is the "System of performing boundary scan test on pin through test point and method thereof." This system improves test efficiency and reduces costs by applying boundary scan functions to test connectors in computer products.

Career Highlights

Xin-Ying Xie has worked with prominent companies such as Inventec Corporation and Inventec (Pudong) Technology Corporation. His experience in these organizations has contributed to his expertise in developing innovative testing solutions.

Collaborations

Throughout his career, Xin-Ying has collaborated with talented individuals, including Qiu-Yue Duan and Ben Han. These partnerships have fostered a creative environment that has led to the development of advanced testing technologies.

Conclusion

Xin-Ying Xie's contributions to boundary-scan testing systems demonstrate his commitment to innovation in the field of electronics. His patents reflect a deep understanding of testing methodologies that enhance efficiency and reduce costs.