Inventec Corp.

Inventec (Pudong) Technology Corporation

Sq Technology(shanghai) Corporation

Xin-Ying Xie

Qiu-Yue Duan

Ben Han

Lin Zhang

A boundary-scan standard pin test system is disclosed. In the system, to-be-tested slots are electrically connected to form different to-be-tested series chains, or riser cards which are inserted into the to-be-tested slots are electrically connected to each other through first boundary-scan input interfaces and first boundary-scan output interfaces thereof or through second boundary-scan input interfaces and second boundary-scan output interfaces thereof, to form different riser-card series chains; a TAP controller provides a boundary-scan format test signal to a to-be-tested series chain or a riser-card series chain to make a test card perform a boundary-scan standard pin test, so as to achieve the technical effect of efficiency of providing the boundary-scan standard pin test for the to-be-tested slots on different to-be-tested boards by a testing machine.

JTAG standard pin test system

A system of performing boundary scan test on pin through test point and a method thereof are disclosed. When an under-test pin of a target connector is determined to be unable to perform a boundary scan test, a test point connected to and closest to the under-test pin is searched, a test signal is transmitted to a target connector, a result signal from the target connector in response to the test signal is received, an expected result and the result signal are compared to generate a test result, so that a boundary scan function can be applied to test a connector of a computer product, to achieve the technical effect of providing a better test range and a better test coverage to improve test efficiency and reduce test cost, compared to conventional boundary scan test.

System of performing boundary scan test on pin through test point and method thereof

A test coverage rate improvement system for pins of tested circuit board and a method thereof are disclosed. In the system, partial pins of a circuit board connector in a tested circuit board are not electrically connected to the boundary scan chip, test pins of the test pin board are pressed with the partial pins by a fixture of a boundary scan interconnect testing workstation to electrically connect the test pins to the partial pins. A test access port controller receives a detection signal for detecting the partial pins, which are not electrically connected to the boundary scan chip, of the circuit board connector through the test pin board from the test adapter card, and determines whether conduction is formed based on the detection signal, thereby achieving the technical effect of improving a test coverage rate for the pins of the tested circuit board.

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Shanghai, China

Xin-Ying Xie