Hangzhou, China

Xin Xia

This inventor holds 1 USPTO granted patent and 3 published patent applications. Top assignee: Huawei Technologies Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xin Xia. Retrieved from https://idiyas.com/inventor/xin-xia-p4ov2x01

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Xin Xia: Inventor in Software Vulnerability Detection

Introduction

Xin Xia is an inventor associated with Hangzhou, China, and Huawei Technologies Co., Ltd. The supplied information identifies 1 patent associated with Xia.

Latest Patents

Xia’s patent, “Systems and Methods for Detection of Software Vulnerability Fix,” describes techniques for identifying and reporting commits that may fix software vulnerabilities. The system preprocesses a repository commit into file-level token sequences, uses a transformer model to create embeddings for the code changes, and combines those embeddings into a representation of the full commit. A classifier then predicts a vulnerability-fix score, which is included in a report identifying the commit.

Career Highlights

The available information connects Xia’s patent work with Huawei Technologies Co., Ltd. The invention applies machine-learning methods to software repository analysis, with the aim of helping identify vulnerability fixes.

Collaborations

The supplied information lists Jiayuan Zhou and Michael Pacheco as Xia’s coworkers. It does not specify their roles in the patent or the nature of their collaboration.

Conclusion

Xin Xia’s listed invention uses transformer-based code analysis and classification to detect potential software vulnerability fixes in repository commits.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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