Company Filing History:
Years Active: 2014-2015
Title: Innovations of Xiaqing Wen in Integrated Circuit Design
Introduction
Xiaqing Wen is a notable inventor based in Sunnyvale, California, recognized for his contributions to the field of integrated circuit design. He holds a total of four patents, showcasing his innovative approach to solving complex problems in electronic systems.
Latest Patents
Wen's latest patents include a "Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test." This invention provides a method for generating ordered capture clocks to detect or locate faults within multiple clock domains in integrated circuits. The method involves generating and shifting in test stimuli to scan cells, applying an ordered sequence of capture clocks, and analyzing output responses to locate any faults. Another significant patent is the "Computer-aided design (CAD) multiple-capture DFT system for detecting or locating crossing clock-domain faults," which employs a similar methodology to enhance fault detection in integrated circuits.
Career Highlights
Xiaqing Wen is currently employed at Syntest Technologies, Inc., where he continues to innovate in the field of electronic design automation. His work focuses on improving the reliability and efficiency of integrated circuits through advanced testing methodologies.
Collaborations
Wen collaborates with esteemed colleagues such as Po-Ching Hsu and Laung-Terng Wang, contributing to a dynamic research environment that fosters innovation and technological advancement.
Conclusion
Xiaqing Wen's contributions to integrated circuit design and fault detection systems highlight his role as a leading inventor in the field. His patents reflect a commitment to enhancing the reliability of electronic systems, making significant strides in technology.