Beijing, China

Xiaotao Sun

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Beijing Technology and Business University. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xiaotao Sun. Retrieved from https://idiyas.com/inventor/xiaotao-sun

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Innovations of Xiaotao Sun in Visual Turbidity Detection

Introduction

Xiaotao Sun is a notable inventor based in Beijing, China. He has made significant contributions to the field of visual turbidity detection. His innovative approach has led to the development of a unique device that enhances the accuracy of turbidity measurements.

Latest Patents

Xiaotao Sun holds a patent for a "Visual turbidity detection device and detection method thereof." This invention includes an observing box, an observing assembly, and a light assembly. The observing box is designed with an observing window and an opening for sample placement. The observing assembly features a first base and a first rotation shaft, allowing for effective sample testing. The light assembly is strategically placed on the inner wall of the observing box to facilitate accurate measurements.

Career Highlights

Xiaotao Sun is affiliated with Beijing Technology and Business University, where he contributes to research and innovation in his field. His work has garnered attention for its practical applications in environmental monitoring and quality control.

Collaborations

Xiaotao has collaborated with colleagues such as Wei Dong and Siting Ye, enhancing the research output and innovation potential within their team.

Conclusion

Xiaotao Sun's contributions to visual turbidity detection exemplify the impact of innovative thinking in scientific research. His patent reflects a commitment to improving measurement techniques, which can benefit various industries.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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