Kyle, TX, United States of America

Xiaohua Luo

This inventor holds 1 USPTO granted patent. Top assignee: Texas State University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xiaohua Luo. Retrieved from https://idiyas.com/inventor/xiaohua-luo-5ec2j0bl

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Xiaohua Luo and Automated Air-Void Analysis in Concrete.

Introduction

Xiaohua Luo is an inventor associated with Texas State University in Kyle, Texas. Luo’s patent work addresses automated analysis of hardened concrete, using three-dimensional imaging and machine learning to identify air voids on a surface.

Latest Patents

Luo is credited with 1 patent: “Three-dimensional photometric reconstruction based automated air-void segmentation system for hardened concrete.” The disclosed method receives multiple images of a surface, reconstructs them into a three-dimensional representation, and processes that representation with an algorithm trained to identify air voids. The patent also describes computing devices and systems that can perform this automated identification.

Career Highlights

The patent reflects an application of computer vision and automated image analysis to concrete assessment. By combining photometric reconstruction with a trained identification algorithm, the invention is designed to support consistent detection of air voids in hardened concrete.

Collaborations

Feng Wang and Jueqiang Tao are listed as Luo’s coworkers. The available information does not specify their roles in the patent or the nature of their collaboration.

Conclusion

Xiaohua Luo’s patent connects three-dimensional reconstruction and automated analysis to the practical task of identifying air voids in hardened concrete.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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