Kanagawa, Japan

Xiaodong Wang

This inventor holds 1 USPTO granted patent. Top assignee: Leader Electronics Corporation. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xiaodong Wang. Retrieved from https://idiyas.com/inventor/xiaodong-wang-mc5uzmjf

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Innovations by Xiaodong Wang in Training Data Generation

Introduction

Xiaodong Wang is a notable inventor based in Kanagawa, Japan. He has made significant contributions to the field of data processing and anomaly detection. His innovative work focuses on generating training data that enhances the accuracy of learned models used in various inspection processes.

Latest Patents

Xiaodong Wang holds a patent for a "Training data generation method, method and device for generating learned model, recording medium, program, and information processing device." This patent describes a method to generate training data based on normal content and anomalous content derived from that normal content. The process involves receiving normal content related to an inspection target and generating training data that includes both the normal content and one or more pieces of anomalous content. This innovation is crucial for determining anomalies in inspection targets effectively.

Career Highlights

Xiaodong Wang is currently associated with Leader Electronics Corporation, where he applies his expertise in data generation and processing. His work at the company emphasizes the importance of accurate data in developing reliable inspection systems.

Conclusion

Xiaodong Wang's contributions to training data generation represent a significant advancement in the field of anomaly detection. His innovative methods are essential for improving the reliability of inspection processes across various industries.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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