Shanghai, China

Xiaocheng Shen

This inventor holds 1 USPTO granted patent. Top assignee: Nuvoton Technology Corporation. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xiaocheng Shen. Retrieved from https://idiyas.com/inventor/xiaocheng-shen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Innovations by Xiaocheng Shen

Introduction

Xiaocheng Shen is a notable inventor based in Shanghai, China. He has made significant contributions to the field of technology, particularly in debugging systems for electronic devices. His work is characterized by a focus on enhancing the functionality and efficiency of chip testing processes.

Latest Patents

Xiaocheng Shen holds a patent for a "Debug system, apparatus and method thereof for providing graphical pin interface." This innovative debug apparatus is designed for debugging a chip under test that has multiple pins. The system includes a processor that controls the chip via a bridge device. Notably, the processor provides graphical data to indicate the pin states of the chip under test, facilitating a more intuitive debugging process.

Career Highlights

Xiaocheng Shen is currently employed at Nuvoton Technology Corporation, where he continues to develop cutting-edge technologies. His expertise in debugging systems has positioned him as a valuable asset to his team and the company.

Collaborations

Xiaocheng Shen collaborates with his coworker, Xiaohui Chen, to further advance their projects and innovations. Their combined efforts contribute to the success of their initiatives at Nuvoton Technology Corporation.

Conclusion

Xiaocheng Shen's contributions to the field of technology, particularly through his patent for a debugging system, highlight his innovative spirit and dedication to improving electronic device testing. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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