Wuhan, China

Xiangkui He

This inventor holds 1 USPTO granted patent. Top assignees: Hubei Superenergic Electric Power Co., Ltd., State Grid Hubei Extra High Voltage Company. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xiangkui He. Retrieved from https://idiyas.com/inventor/xiangkui-he

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Xiangkui He: Applying Image Recognition to Insulator Fault Detection

Introduction

Xiangkui He is an inventor based in Wuhan, China. His patent work addresses the detection of electrical insulator discharge faults using image recognition and a trained neural network.

Latest Patents

The provided information lists one patent for He: “Detection Method and Detection Device for Detecting Fault of Insulator Discharge Based on Image Recognition.” The method builds an ultraviolet image dataset for electrical equipment and uses it to train a neural network based on YOLOV5-T. The model includes CBS, CST, Concat, 1D-attention, Upsample, and Detect modules. Once trained, it analyzes input images and produces fault-detection results. The associated device is configured to implement the method. He is credited with 1 patent.

Career Highlights

He is associated with State Grid Hubei Extra High Voltage Company and Hubei Superenergic Electric Power Co., Ltd. His listed invention applies computer vision and neural-network techniques to the inspection of electrical equipment.

Collaborations

Shenli Wang is identified as He’s coworker. The provided information does not specify their roles or describe particular joint projects.

Conclusion

Xiangkui He’s listed patent combines ultraviolet imaging and neural-network-based recognition to support the detection of insulator discharge faults in electrical equipment.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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