Xiangjun Feng

Title: Innovations by Xiangjun Feng in Nonlinear Transition Shift Measurement

Introduction

Xiangjun Feng is a notable inventor based in San Jose, CA, who has made significant contributions to the field of data storage technology. He is associated with the International Business Machines Corporation (IBM) and holds a patent that addresses critical challenges in measuring nonlinear transition shifts in recording media.

Latest Patents

Xiangjun Feng's patent, titled "Process for measuring nonlinear transition shift (NLTS) at high recording densities with a giant magnetoresistive (GMR) head," presents a novel measurement procedure for read/write heads that utilize giant magnetoresistive technology. This invention incorporates pulse-shape distortion effects on recording nonlinearity, which can greatly influence existing theoretical formulas for calculating nonlinearity correction factors from measured partial erasure values. The method also includes a second-order approximation of the equation of NLTS and the nonlinearity correction factor.

Career Highlights

Throughout his career, Xiangjun Feng has focused on enhancing the accuracy of NLTS measurements. His innovative approach integrates transition broadening effects and partial erasure into the measurement procedure, allowing for precise isolation of NLTS from unrelated factors. The process involves performing a fifth harmonic elimination test to measure initial nonlinearity values, followed by two partial erasure tests at different densities to compute the NLTS accurately.

Collaborations

Xiangjun Feng has collaborated with esteemed colleagues such as Peter Chen-I Fang and Terence Tin-Lok Lam, contributing to advancements in the field of data storage technology.

Conclusion

Xiangjun Feng's work exemplifies the intersection of innovation and technology in the realm of data storage. His contributions, particularly in the measurement of nonlinear transition shifts, have the potential to significantly enhance the performance of recording media.