Aksu, China

Xiangdong Liu

This inventor holds 1 USPTO granted patent. Top assignees: Xinjiang Institute of Technology, Zhejiang University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xiangdong Liu. Retrieved from https://idiyas.com/inventor/xiangdong-liu-b0ylm0um

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Xiangdong Liu and His Cable-Inspection Invention.

Introduction

Xiangdong Liu is an inventor associated with Aksu, China. His work includes a patent for image processing in cable quality inspection, and the supplied information lists 1 patent.

Latest Patents

Liu’s patent, “Method for Eliminating Scratches in Cross-Sectional Image of Cable,” describes a process for reducing scratches in images used to inspect cable cross-sections. The method acquires an original image, applies dilation and erosion to create a processed image, and fuses the two images before producing a scratch-eliminated image. The resulting image can be used in cable quality detection.

By combining image modalities, the method aims to preserve information from the original image while improving the accuracy of cable inspection. This approach addresses the challenge of distinguishing image scratches from features relevant to assessing cable quality.

Career Highlights

The supplied information associates Liu with Zhejiang University and Xinjiang Institute of Technology. These affiliations provide context for his professional and research background.

Collaborations

Liu’s listed coworkers include Aihua Yu and Beiping Hou. Their names are associated with his professional or research network in the information provided.

Conclusion

Xiangdong Liu’s cable-inspection patent applies image processing and multimodal fusion to help improve the accuracy of quality detection. His listed affiliations and collaborators further situate his work within an academic and research context.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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