Xiang Wu

Title: Innovations by Xiang Wu in Memory Testing Technology

Introduction

Xiang Wu is an accomplished inventor based in Shenzhen, China. He has made significant contributions to the field of integrated circuit testing, particularly in memory operations. His innovative approach has led to the development of a unique method for testing memory in functional mode.

Latest Patents

Xiang Wu holds a patent for a technique to operate memory in functional mode under LBIST test. This method involves performing a structural test on an integrated circuit using data obtained from operating the memory in a functional mode. The patent outlines an integrated circuit that includes a memory mode selection module, a memory module, and an output selection module. The memory mode selection module is designed to receive both functional mode and test mode signals, selectively transmitting one based on a control signal's state. The memory module stores data corresponding to the received signal, while the output selection module transmits this data to downstream circuitry for structural testing, such as logic built-in self-test.

Career Highlights

Xiang Wu is currently employed at Future Wei Technologies, Inc., where he continues to advance his research and development efforts. His work has been instrumental in enhancing the reliability and efficiency of memory testing processes in integrated circuits.

Collaborations

Xiang collaborates with Zhiyuan Wang, a talented female engineer, at Future Wei Technologies, Inc. Their partnership has fostered innovative solutions in the field of memory technology.

Conclusion

Xiang Wu's contributions to memory testing technology exemplify the impact of innovative thinking in the field of integrated circuits. His patent and ongoing work at Future Wei Technologies, Inc. highlight the importance of advancements in this critical area of technology.