This inventor holds 1 USPTO granted patent. Top assignees: Fih (Hong Kong) Limited, Shenzhen Futaihong Precision Industry Co., Ltd.. Active years: 2011.
Company Filing History:
1 out of 1,166 
1 out of 860 Years Active: 2011
Title: Xian-Cui Du: Innovator in Electronic Device Testing
Introduction
Xian-Cui Du is a notable inventor based in Shenzhen, China. He has made significant contributions to the field of electronic device testing, particularly with his innovative designs and patents. His work focuses on enhancing the reliability and performance of electronic components.
Latest Patents
Xian-Cui Du holds a patent for a "Fatigue test apparatus for thin element of electronic device." This apparatus is designed to test the durability of thin workpieces used in electronic devices. It includes a supporting module, a driving mechanism, a first connecting module, a second connecting module, a first holding post, a second holding post, and a computer system. The first and second connecting modules are fixed to the supporting module, while the holding posts are driven to rotate by the driving mechanism, allowing for comprehensive testing of electronic components.
Career Highlights
Throughout his career, Xian-Cui Du has worked with prominent companies such as Fih (Hong Kong) Limited and Shenzhen Futaihong Precision Industry Co., Ltd. His experience in these organizations has allowed him to develop and refine his innovative ideas in electronic device testing.
Collaborations
Xian-Cui Du has collaborated with talented individuals in his field, including Li-Ping Huang and Lei Li. These partnerships have contributed to the advancement of technology in electronic device testing.
Conclusion
Xian-Cui Du is a distinguished inventor whose work in electronic device testing has led to valuable innovations. His patent for a fatigue test apparatus exemplifies his commitment to improving the reliability of electronic components. His contributions continue to influence the industry positively.