Eindhoven, Netherlands

Xi Zhang

This inventor holds 1 USPTO granted patent. Top assignee: Nxp B.v.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xi Zhang. Retrieved from https://idiyas.com/inventor/xi-zhang-fu8g2izc

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: The Innovations of Xi Zhang

Introduction

Xi Zhang is a prominent inventor based in Eindhoven, Netherlands. She has made significant contributions to the field of technology, particularly in the area of measurement devices. Her innovative work has led to the development of a unique patent that showcases her expertise and creativity.

Latest Patents

Xi Zhang holds a patent titled "Deriving a capacitance-ratio information, device and method." This patent describes an attenuation measurement device that is designed to enhance the accuracy of capacitance measurements. The invention reflects her commitment to advancing technology and improving measurement techniques.

Career Highlights

Xi Zhang is currently employed at NXP B.V., a leading semiconductor company known for its innovative solutions. Her role at NXP B.V. allows her to collaborate with other talented professionals in the industry, furthering her impact on technology and innovation.

Collaborations

Throughout her career, Xi Zhang has worked alongside notable colleagues, including Erwin Johannes Gerardus Janssen and Harish Kundur Subramaniyan. These collaborations have enriched her work and contributed to the success of her projects.

Conclusion

In summary, Xi Zhang is a talented inventor whose work in measurement devices has made a significant impact in her field. Her patent and collaborations highlight her dedication to innovation and technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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