Ningde, China

Xi Wang

USPTO Granted Patents = 3 

 

Average Co-Inventor Count = 3.6

ph-index = 1


Location History:

  • Ningde, CN (2024)
  • Fujian, CN (2024)

Company Filing History:


Years Active: 2024-2025

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3 patents (USPTO):Explore Patents

Title: Innovations of Xi Wang in Defect Detection Technology

Introduction

Xi Wang is a notable inventor based in Ningde, China. He has made significant contributions to the field of defect detection technology, holding a total of 3 patents. His work focuses on enhancing the accuracy and sensitivity of detection methods through innovative approaches.

Latest Patents

Xi Wang's latest patents include a defect detection method and apparatus, as well as a computer-readable storage medium. The defect detection method involves obtaining a to-be-detected image and generating a feature map that includes spatial position coordinate information. This method modifies the neural network structure to improve sensitivity to spatial positions, thereby increasing the accuracy of detecting specific defect types. Additionally, his detection method and device utilize multiple confidence levels corresponding to various detection items, allowing for a more precise determination of detection results based on established thresholds.

Career Highlights

Xi Wang is currently employed at Contemporary Amperex Technology Co., Ltd., where he continues to develop innovative solutions in defect detection. His work has been instrumental in advancing the capabilities of detection technologies, making them more effective in various applications.

Collaborations

Xi Wang collaborates with talented individuals such as Zhiyu Wang and Guannan Jiang, contributing to a dynamic and innovative work environment.

Conclusion

Xi Wang's contributions to defect detection technology exemplify the impact of innovative thinking in enhancing accuracy and efficiency. His patents reflect a commitment to advancing the field and improving detection methods for various applications.

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