Shanghai, China

Xi-Feng Gao

This inventor holds 1 USPTO granted patent. Top assignee: Omnivision Technologies, Inc.. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xi-Feng Gao. Retrieved from https://idiyas.com/inventor/xi-feng-gao

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: The Innovations of Xi-Feng Gao

Introduction

Xi-Feng Gao is a prominent inventor based in Shanghai, China. He is known for his contributions to the field of image sensor technology. His innovative work has led to the development of a patented technology that enhances the performance of image sensors.

Latest Patents

Xi-Feng Gao holds a patent for a "Backside illuminated image sensor with improved contact area." This invention includes a semiconductor material with a front side and a back side. The design features a shallow trench isolation (STI) structure, an interlayer dielectric, an intermetal dielectric, and a contact area. The STI structure extends from the front side into the semiconductor material, while the contact area is strategically placed near the lateral edge of the semiconductor. This innovative design improves the efficiency and performance of image sensors.

Career Highlights

Xi-Feng Gao is currently employed at Omnivision Technologies, Inc., where he continues to push the boundaries of image sensor technology. His work has significantly impacted the industry, making him a valuable asset to his company and the field of innovation.

Collaborations

Some of his notable coworkers include Dyson Hsinchih Tai and Cunyu Yang. Their collaboration has fostered an environment of creativity and innovation within the company.

Conclusion

Xi-Feng Gao's contributions to image sensor technology exemplify the spirit of innovation. His patented work not only enhances the functionality of image sensors but also showcases the importance of collaboration in technological advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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