Kriftel, Germany

Xenia Holdgrün

This inventor holds 1 USPTO granted patent. Top assignee: Hoechst Aktiengesellschaft. Active years: 2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xenia Holdgrün. Retrieved from https://idiyas.com/inventor/xenia-holdgranduumln

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2002

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1 patent (USPTO):Explore Patents

Title: Xenia Holdgrün: Innovator in Crop Protection

Introduction

Xenia Holdgrün is a notable inventor based in Kriftel, Germany. She has made significant contributions to the field of crop protection through her innovative research and development of chemical compounds.

Latest Patents

Xenia Holdgrün holds one patent titled "Substituted (hetero) aryl compounds, process for their preparation, agents containing them and their use as safeners." This patent focuses on compounds that are effective as safeners, protecting crop plants from the phytotoxic side effects of herbicides. The compounds described in her patent are suitable for agricultural applications, enhancing the safety and efficacy of herbicide use.

Career Highlights

Xenia is associated with Hoechst Aktiengesellschaft, a prominent company in the chemical and pharmaceutical industry. Her work at Hoechst has allowed her to explore and develop innovative solutions for agricultural challenges.

Collaborations

Throughout her career, Xenia has collaborated with esteemed colleagues such as Lothar Willms and Klaus Bauer. These partnerships have contributed to her success and the advancement of her research.

Conclusion

Xenia Holdgrün's contributions to crop protection through her patented innovations highlight her role as a leading inventor in the agricultural sector. Her work continues to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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