Cambridge, Canada

Xavier M H Albert-Lebrun

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Com Dev International, Inc.. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xavier M H Albert-Lebrun. Retrieved from https://idiyas.com/inventor/xavier-m-h-albert-lebrun

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Innovations of Xavier M H Albert-Lebrun

Introduction

Xavier M H Albert-Lebrun is a notable inventor based in Cambridge, Canada. He has made significant contributions to the field of electrical engineering, particularly in the area of S-parameter measurements. His innovative approach has led to the development of a unique method for tracking calibration in scattering parameter test systems.

Latest Patents

Albert-Lebrun holds a patent for a "Method and system for tracking scattering parameter test system calibration." This patent describes methods for correcting S-parameter measurements for a Device Under Test (DUT). The process involves coupling a tracking module with a set of electrical standards to a measurement device, determining an initial calibration, and tracking changes to ensure accurate measurements.

Career Highlights

Xavier M H Albert-Lebrun is currently employed at Com Dev International, Inc. His work focuses on enhancing the accuracy of S-parameter measurements, which are crucial for various applications in electrical engineering. His innovative methods have the potential to improve the reliability of testing in the industry.

Collaborations

Some of his notable coworkers include Mario Lisi and Charles Van Lingen. Their collaboration has contributed to the advancement of technologies in their field.

Conclusion

Xavier M H Albert-Lebrun's contributions to the field of electrical engineering through his innovative patent demonstrate his commitment to advancing technology. His work continues to influence the accuracy of S-parameter measurements in various applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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