Klong Luang, Thailand

Worawarit Kobsiriphat

This inventor holds 1 USPTO granted patent. Top assignee: Western Digital (Fremont), Inc.. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Worawarit Kobsiriphat. Retrieved from https://idiyas.com/inventor/worawarit-kobsiriphat

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 38(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: The Innovations of Worawarit Kobsiriphat

Introduction

Worawarit Kobsiriphat is an accomplished inventor based in Klong Luang, Thailand. He has made significant contributions to the field of technology, particularly in the area of testing workpiece overcoats. His innovative approach has led to the development of a unique method and apparatus for testing these overcoats.

Latest Patents

Worawarit holds 1 patent for his invention titled "Testing workpiece overcoat." This patent describes a method and apparatus designed to enhance the testing process of workpiece overcoats, showcasing his commitment to advancing technology in this area.

Career Highlights

Worawarit is currently employed at Western Digital (Fremont), Inc., where he applies his expertise in technology and innovation. His work at this leading company allows him to contribute to the development of cutting-edge storage solutions.

Collaborations

Throughout his career, Worawarit has collaborated with talented individuals such as Laddawan Supadee and Krisda Siangchaew. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Worawarit Kobsiriphat is a notable inventor whose work in testing workpiece overcoats exemplifies his innovative spirit. His contributions to technology and collaboration with skilled colleagues highlight his dedication to advancing the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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