Uijeongbu, South Korea

Woong-Hae Choi

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Woong-Hae Choi. Retrieved from https://idiyas.com/inventor/woong-hae-choi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

 

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Innovations by Woong-Hae Choi

Introduction

Woong-Hae Choi is a notable inventor based in Uijeongbu, South Korea. He has made significant contributions to the field of automated testing, particularly in the area of electrostatic discharge. His work is recognized for its practical applications in enhancing device reliability.

Latest Patents

Woong-Hae Choi holds a patent for an "Apparatus and method for automated testing of device under test." This invention provides a systematic approach to testing the electrostatic discharge of a Device Under Test (DUT). The apparatus applies an electrostatic pulse to the DUT, detects any malfunction types, and transmits control commands to revert the DUT to its normal mode based on the detected issues. This innovation is crucial for ensuring the performance and safety of electronic devices.

Career Highlights

Choi is currently employed at Samsung Electronics Co., Ltd., a leading global technology company. His role involves developing advanced testing methodologies that contribute to the quality assurance of electronic products. His expertise in automated testing has positioned him as a valuable asset within the organization.

Collaborations

Some of his notable coworkers include Jae-Kyu Lee and Han-Awl Lee. Their collaborative efforts in research and development have further advanced the field of automated testing.

Conclusion

Woong-Hae Choi's contributions to automated testing and his innovative patent reflect his commitment to improving electronic device reliability. His work continues to influence the industry and enhance product safety standards.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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