Daejeon, South Korea

Woo-Myo Lee

This inventor holds 1 USPTO granted patent. Top assignee: Electronics and Telecommunications Research Institute. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Woo-Myo Lee. Retrieved from https://idiyas.com/inventor/woo-myo-lee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Innovations by Woo-Myo Lee

Introduction

Woo-Myo Lee is a notable inventor based in Daejeon, South Korea. He has made significant contributions to the field of technology, particularly in the area of anomaly detection systems. His work is characterized by a focus on enhancing the reliability and efficiency of monitoring systems.

Latest Patents

Woo-Myo Lee holds a patent for a "Method and apparatus for detecting anomaly status based on system screen." This innovative method involves receiving the output screen of a target device to be monitored. It includes setting a target region for examination, calculating a feature value vector corresponding to the state of that region, and using a pretrained auto-encoder to calculate an anomaly score. Ultimately, this method determines whether the monitored device is functioning anomalously.

Career Highlights

Woo-Myo Lee is affiliated with the Electronics and Telecommunications Research Institute, where he continues to advance his research and development efforts. His work has been instrumental in improving monitoring technologies, which are crucial in various applications.

Collaborations

Some of his notable coworkers include Hyung-Kwan Kim and Jong-Won Choi, who have collaborated with him on various projects within the institute.

Conclusion

Woo-Myo Lee's contributions to technology through his innovative patent demonstrate his commitment to enhancing monitoring systems. His work continues to influence the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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