Seoul, South Korea

Wonjun Yoo

This inventor holds 1 USPTO granted patent and 4 published patent applications. Top assignee: Makinarocks Co., Ltd.. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wonjun Yoo. Retrieved from https://idiyas.com/inventor/wonjun-yoo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2024

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Innovator Profile: Wonjun Yoo

Introduction

Wonjun Yoo is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of semiconductor technology, particularly through his innovative methods for evaluating device placement.

Latest Patents

Wonjun Yoo holds a patent for a method titled "Method for performing double clustering to evaluate placement of semiconductor devices." This patent discloses a method that involves receiving connection relationship information representing the connections between semiconductor devices. The method utilizes first reference information to perform clustering on the semiconductor devices and subsequently conducts sub-clustering within the generated clusters using second reference information.

Career Highlights

Currently, Wonjun Yoo is associated with Makinarocks Co., Ltd., where he applies his expertise in semiconductor device evaluation. His work has been instrumental in advancing the methodologies used in the industry.

Collaborations

He collaborates with talented individuals such as Wooshik Myung and Jiyoon Lim, contributing to a dynamic work environment that fosters innovation.

Conclusion

Wonjun Yoo's contributions to semiconductor technology through his patent and collaborative efforts highlight his role as a key innovator in the field. His work continues to influence advancements in device placement evaluation methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…