Gyeonggi-do, South Korea

Won-Young Lee

This inventor holds 1 USPTO granted patent. Top assignee: Dongjin Semichem Co., Ltd.. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Won-Young Lee. Retrieved from https://idiyas.com/inventor/won-young-lee-msfqsp3i

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: The Innovations of Won-Young Lee

Introduction

Won-Young Lee is a notable inventor based in Gyeonggi-do, South Korea. He has made significant contributions to the field of liquid crystal displays through his innovative patents. His work focuses on enhancing the performance and reliability of electronic devices.

Latest Patents

Won-Young Lee holds a patent for a "Conductive composition for forming a ground electrode of a liquid crystal display, and a method of forming a ground electrode using the same." This invention relates to a conductive composition that enables the formation of a back electrode for liquid crystal devices. The composition provides excellent coating uniformity, low surface resistance, high transmittance, and surface hardness. Notably, it demonstrates exceptional reliability over 500 hours.

Career Highlights

He is currently employed at Dongjin Semichem Co., Ltd., where he continues to develop innovative solutions in the field of electronics. His work has contributed to advancements in display technology, making significant impacts on the industry.

Collaborations

Some of his coworkers include Jung Yul Lee and Ja Hun Byeon, who collaborate with him on various projects within the company.

Conclusion

Won-Young Lee's contributions to the field of liquid crystal displays highlight his innovative spirit and dedication to advancing technology. His patent reflects a commitment to improving the performance and reliability of electronic devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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