Incheon, South Korea

Won Woo Lee

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Kookmin University. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Won Woo Lee. Retrieved from https://idiyas.com/inventor/won-woo-lee-euqw5m4t

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Innovations of Won Woo Lee

Introduction

Won Woo Lee is a notable inventor based in Incheon, South Korea. He has made significant contributions to the field of object detection through his innovative methods and technologies. His work is particularly relevant in the context of deep learning and image processing.

Latest Patents

Won Woo Lee holds a patent for a "Method and apparatus for detecting an object based on identification information of the object in continuous images." This patent describes an object detection method that involves acquiring identification information from multiple images captured in sequence. The method corrects the identification information of an object detected in later images based on data from earlier images, enhancing the accuracy of object detection.

Career Highlights

Lee is affiliated with Kookmin University, where he continues to advance his research and development in the field of technology. His work has implications for various applications, including surveillance, autonomous vehicles, and robotics.

Collaborations

He collaborates with Yoon Suk Choi, contributing to the advancement of their shared research interests.

Conclusion

Won Woo Lee's innovative approach to object detection showcases the potential of deep learning technologies in improving image analysis. His contributions are paving the way for future advancements in this critical area of research.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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