Sungnam, South Korea

Won Suk Chang

This inventor holds 1 USPTO granted patent. Top assignee: Kolon Industries, Inc.. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Won Suk Chang. Retrieved from https://idiyas.com/inventor/won-suk-chang-w22hq9v4

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: Won Suk Chang and His Solar Control Film Invention.

Introduction

Won Suk Chang is an inventor based in Sungnam, South Korea. His patent work includes a solar control film designed for use on automobile, building, and exhibition-space windows.

Latest Patents

Chang’s listed patent, “Solar control film,” describes a layered film intended to reduce sunlight and help prevent secondary injuries from broken glass in an accident. Its layers include a surface protective layer, a plastic film substrate, a hologram-engraved layer, a metal deposition layer, a pressure-sensitive adhesive layer, and a release film. The invention is described as blocking visible and infrared rays while also providing an antifog effect and a decorative hologram appearance. Chang is credited with 1 patent.

Career Highlights

Chang is associated with Kolon Industries, Inc. His listed invention combines solar-control performance with features intended to improve safety, visibility, and appearance.

Collaborations

Chang’s listed coworkers include Chang Sup Ji and Jong Min Park. The available information does not specify their roles in developing or patenting the solar control film.

Conclusion

Won Suk Chang’s solar control film patent brings together sunlight reduction, an antifog effect, a holographic finish, and a design intended to help contain broken glass.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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